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| IC Test System Control Software |
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| The Amicronix Test System Controller
(TSC) software runs under Windows NT/2000/XP to
provide a complete menu driven user interface for all system activities.
The power and scope of the software is comparable to that of much
higher priced testers. All Single and Multi-Site Testing activities
are supported, including auto-calibration, maintenance, test program
development, debugging, production wafer sort and final testing, device
characterization/correlation, data collection/analysis, as well as
networked remote multiple tester monitoring and program management functions.
New test programs are created
in skeleton form automatically by the Integrated Borland Delphi/C++
Editor/Compiler/Debugger program, which greatly simplifies program generation. Test programs may be written and tested off line on an ordinary PC using the Tester Simulation Mode which accurately shows the programmed hardware state. Additional Engineering Debug Modes may be enabled to trace program flow without source code, trap on test conditions to modify the test setup interactively, view the current hardware state, handle alarms, and synchronize events. Powerful test optimization tools are available such as the Virtual Scope to determine rise or settling times, and the Test Time Recorder which shows the code execution time, wait time inside each test, handler index time, etc. Lot and Wafer Summary Reports and measurement data may be viewed during test and off line as raw data, or graphically using the Chart and Wafer Mapping Utilities. System Checker Programs assure that all system hardware modules are operating at the specifications for which they were designed. Autohandler and Wafer Prober Control via TTL/GPIB/Serial/Ethernet is simplified to a one-time menu selection. Integrated Networking Features can automatically download current program files or upload collected data files without operator intervention. Extensive Context Sensitive Help for all tester operations is just a keystroke away.
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