Series 300 High Speed Digital Series 400 Control Software Series 500

Series 400 IC Test System

· PARALLEL TESTING UP TO 32 MULTI-SITES
· OPTIMIZED FOR MULTI-SITE PROBERS AND HANDLERS
· UP TO 96 PINS STIMULUS-MEASURE
· INCLUDING UP TO 64 DEDICATED INSTRUMENTS

The tester main bay contains system power supplies, card cage with instrument modules, and the user I/O panel. A high performance computer communicates with the tester instrumentation via the Tester Interface Module connected to the high speed address/data bus.

The System Calibration Module provides a certifiably traceable (NIST) calibration reference. Auto-calibration reference data is stored in EEPROM on the calibration module for use in calibrating the other instruments. System calibration is extremely fast and accurate.

DC stimulus and measurement is provided by Voltage/Current (VI) Stimulus/Measure Modules with up to 2A and 100V capability. The system is configurable from 10 Single or Dual matrixed VI modules, and 64 non-matrixed Octal VI modules.

Multiple instrument modules may be switched to up to 96 device pins through the Cross Point Matrix Modules. The matrix is composed of mercury relays, switching force, sense, and guard lines of each analog channel. The guard lines are designed to protect the user device from stray leakage current.

An expandable array of TTL Relay Control Bits is provided for DUT board switching requirements.

Other instrument options available include the DC Function Test Module, Time Measurement Unit / Pulse Generator, Arbitrary Function Generator, AC Voltmeter, and GPIB Controller.